Nahmad-Rohen, Alexander ORCID: https://orcid.org/0000-0002-2712-7373, Regan, David ORCID: https://orcid.org/0000-0003-0420-3481, Borri, Paola ORCID: https://orcid.org/0000-0002-7873-3314 and Langbein, Wolfgang ORCID: https://orcid.org/0000-0001-9786-1023 2022. Simultaneous microscopic imaging of thickness and refractive index of thin layers by heterodyne interferometric reflectometry (HiRef). Journal of Physics D: Applied Physics 55 (5) , 054001. 10.1088/1361-6463/ac22d4 |