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Number of items: 4.

Clark, D. ORCID: https://orcid.org/0000-0002-1090-2361, Guo, Dongsheng, Lathi, D., Harid, N. ORCID: https://orcid.org/0000-0001-8203-1895, Griffiths, H., Ainsley, Alan and Haddad, A. ORCID: https://orcid.org/0000-0003-4153-6146 2014. Controlled large-scale tests of practical grounding electrodes--part II: comparison of analytical and numerical predictions with experimental results. IEEE Transactions on Power Delivery 29 (3) , pp. 1240-1248. 10.1109/TPWRD.2014.2298358

Guo, Dongsheng, Clark, David ORCID: https://orcid.org/0000-0002-1090-2361, Lathi, Deepak Kamlakar, Harid, Noureddine ORCID: https://orcid.org/0000-0001-8203-1895, Griffiths, Huw, Ainsley, Alan and Haddad, Abderrahmane ORCID: https://orcid.org/0000-0003-4153-6146 2014. Controlled large-scale tests of practical grounding electrodes--part I: test facility and measurement of site parameters. IEEE Transactions on Power Delivery 29 (3) , pp. 1231-1239. 10.1109/TPWRD.2013.2284261

Clark, David ORCID: https://orcid.org/0000-0002-1090-2361, Griffiths, Huw, Harid, Noureddine ORCID: https://orcid.org/0000-0001-8203-1895, Haddad, Abderrahmane ORCID: https://orcid.org/0000-0003-4153-6146 and Guo, Dongsheng 2013. Wireless measurement system for a large-scale grounding electrode test facility. Presented at: 48th Power Engineering Conference (UPEC), Dublin, Ireland, 2-5 Sept 2013. Power Engineering Conference (UPEC), 2013 48th International Universities'. Picastaway, NJ: IEEE, pp. 1-4. 10.1109/UPEC.2013.6714998

Guo, Dongsheng, Lathi, Deepak, Harid, Noureddine ORCID: https://orcid.org/0000-0001-8203-1895, Griffiths, Huw, Haddad, Abderrahmane ORCID: https://orcid.org/0000-0003-4153-6146 and Ainsley, A. 2010. Experimental investigation into the performance of large-scale earthing electrodes. Presented at: 2010 International Conference on High Voltage Engineering and Application (ICHVE), New Orleans, LA, USA, 11-14 October 2010. Proceedings of the 2010 International Conference on High Voltage Engineering and Application (ICHVE). Los Alamitos, CA: IEEE, pp. 465-468. 10.1109/ICHVE.2010.5640727

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