Mierczak, Lukasz P., Melikhov, Yevgen ORCID: https://orcid.org/0000-0002-9787-5238 and Jiles, David C. 2014. Determining residual stress depth profiles using the magnetic Barkhausen effect. IEEE Transactions on Magnetics 50 (10) , pp. 1-5. 10.1109/TMAG.2014.2329455 |
Official URL: http://dx.doi.org/10.1109/TMAG.2014.2329455
Item Type: | Article |
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Date Type: | Publication |
Status: | Published |
Schools: | Engineering |
Subjects: | T Technology > TA Engineering (General). Civil engineering (General) |
Publisher: | Institute of Electrical and Electronics Engineers |
ISSN: | 0018-9464 |
Last Modified: | 06 Jul 2023 02:22 |
URI: | https://orca.cardiff.ac.uk/id/eprint/93144 |
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