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Comparison of two AFM probe inspection techniques for three-dimensional tip characterisation

Alraziqi, Zaynab, Mukhtar, Nur Farah Hafizah and Brousseau, Emmanuel Bruno Jean-Paul 2016. Comparison of two AFM probe inspection techniques for three-dimensional tip characterisation. Presented at: EUSPEN: 16th International Conference & Exhibition, Nottingham, UK, 30 May - 3 June 2016. Published in: Bointon, P., Leach, R. and Southon, N. eds. Proceedings of the 16th International Conference of the European Society for Precision Engineering and Nanotechnology. Bedford: EUSPEN, pp. 59-60.

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Item Type: Conference or Workshop Item (Poster)
Date Type: Publication
Status: Published
Schools: Centre for Advanced Manufacturing Systems At Cardiff (CAMSAC)
Engineering
Subjects: T Technology > TS Manufactures
Publisher: EUSPEN
ISBN: 9780956679086
Last Modified: 02 Aug 2019 12:51
URI: http://orca-mwe.cf.ac.uk/id/eprint/91524

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