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A titanium nitride absorber for controlling Optical Crosstalk in horn-coupled aluminum LEKID arrays for millimeter wavelengths

McCarrick, H., Flanigan, D., Jones, G., Johnson, B. R., Ade, Peter A. R., Bradford, K., Bryan, S., Cantor, R., Che, G., Day, P., Doyle, Simon Michael, Leduc, H., Limon, M., Mauskopf, Philip Daniel, Miller, A., Mroczkowski, T., Tucker, Carole and Zmuidzinas, J. 2016. A titanium nitride absorber for controlling Optical Crosstalk in horn-coupled aluminum LEKID arrays for millimeter wavelengths. Journal of Low Temperature Physics 184 (1) , pp. 154-160. 10.1007/s10909-015-1424-5

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Abstract

We discuss the design and measured performance of a titanium nitride (TiN) mesh absorber we are developing for controlling optical crosstalk in horn-coupled lumped-element kinetic inductance detector (LEKID) arrays for millimeter wavelengths. This absorber was added to the fused silica anti-reflection coating attached to previously characterized, 20-element prototype arrays of LEKIDs fabricated from thin-film aluminum on silicon substrates. To test the TiN crosstalk absorber, we compared the measured response and noise properties of LEKID arrays with and without the TiN mesh. For this test, the LEKIDs were illuminated with an adjustable, incoherent electronic millimeter-wave source. Our measurements show that the optical crosstalk in the LEKID array with the TiN absorber is reduced by 66 % on average, so the approach is effective and a viable candidate for future kilo-pixel arrays. © 2015 Springer Science+Business Media New York

Item Type: Article
Date Type: Publication
Status: Published
Schools: Physics and Astronomy
Subjects: Q Science > QC Physics
Uncontrolled Keywords: Cosmic microwave background; Kinetic inductance detectors; Millimeter-wave sensors; Aluminum; Aluminum coatings; Antireflection coatings; Cosmology; Crosstalk; Fused silica; Inductance; Mesh generation; Microwave sensors; Millimeter waves; Nitrides; Reflective coatings; Titanium; Titanium compounds; Cosmic microwave backgrounds; Kinetic inductance detectors; Millimeter wave sensor; Millimeter wavelength; Noise properties; Optical cross-talk; Silicon substrates; Thin film aluminum
Publisher: Springer New York
ISSN: 0022-2291
Date of Acceptance: 8 December 2015
Last Modified: 24 Oct 2018 22:21
URI: http://orca-mwe.cf.ac.uk/id/eprint/86529

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