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Magnetic force microscopy study of magnetization reversal in sputtered FeSiAl(N) films

Lo, C. C. H., Snyder, John Evan, Leib, J., Chen, R., Sutton, B., Kramer, M. J., Jiles, David and Kief, M. T. 2001. Magnetic force microscopy study of magnetization reversal in sputtered FeSiAl(N) films. Journal of Applied Physics 89 (5) , pp. 2868-2872. 10.1063/1.1344579

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Item Type: Article
Schools: Engineering
ISSN: 0021-8979
Last Modified: 04 Jun 2017 02:04
URI: http://orca-mwe.cf.ac.uk/id/eprint/8298

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