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A measurement test-set for characterisation of high power LDMOS transistors including memory effects

Alghanim, A., Benedikt, Johannes and Tasker, Paul 2005. A measurement test-set for characterisation of high power LDMOS transistors including memory effects. Presented at: 10th IEEE High Frequency Postgraduate Student Colloquium, Leeds, UK, pp. 29-32.

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Item Type: Conference or Workshop Item (Paper)
Schools: Engineering
Last Modified: 04 Jun 2017 02:02
URI: http://orca-mwe.cf.ac.uk/id/eprint/7823

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