Apparatus for measuring Seebeck coefficient and electrical resistivity of small dimension samples using infrared microscope as temperature sensor

Jaafar, W. M. N. Wan, Snyder, J. E. and Gao, Min ORCID: https://orcid.org/0000-0001-9591-5825 2013. Apparatus for measuring Seebeck coefficient and electrical resistivity of small dimension samples using infrared microscope as temperature sensor. Review of Scientific Instruments 84 (5) , 054903. 10.1063/1.4805016

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Abstract

aip Publishers PublicationsTopicsCollections|LibrariansAuthors Your access is provided by: Cardiff University Register to create your user account, or sign in if you have an existing account Cardiff University Libraries Additional sign in via Username Sign in via Shibboleth/Athens My cart Export citations Add to my favorites Recommend to library Subscribe to email alerts Submit an article Reprints & Permissions Subscribe to RSS Access Key Free Content Open Access Content Subscribed Content Free Trial Content Home > Publishers > AIP Publishing > Review of Scientific Instruments > Volume 84, Issue 5 > Article banner image Apparatus for measuring Seebeck coefficient and electrical resistivity of small dimension samples using infrared microscope as temperature sensor BUY: USD28.00 RENT: $4.00 W. M. N. Wan Jaafar1, J. E. Snyder1 and Gao Min1 + VIEW AFFILIATIONS Rev. Sci. Instrum. 84, 054903 (2013); http://dx.doi.org/10.1063/1.4805016 PREVIOUS ARTICLETABLE OF CONTENTSNEXT ARTICLE facebook twitter Share this page separator email print this page Abstract Full Text References (15)Cited By (4)Data & Media Metrics Related An apparatus for measuring the Seebeck coefficient (α) and electrical resistivity (ρ) was designed to operate under an infrared microscope. A unique feature of this apparatus is its capability of measuring α and ρ of small-dimension (sub-millimeter) samples without the need for microfabrication. An essential part of this apparatus is a four-probe assembly that has one heated probe, which combines the hot probe technique with the Van der Pauw method for “simultaneous” measurements of the Seebeck coefficient and electrical resistivity. The repeatability of the apparatus was investigated over a temperature range of 40 °C–100 °C using a nickel plate as a standard reference. The results show that the apparatus has an uncertainty of ±4.9% for Seebeck coefficient and ±5.0% for electrical resistivity. The standard deviation of the apparatus against a nickel reference sample is −2.43 μVK−1 (−12.5%) for the Seebeck coefficient and −0.4 μΩ cm (−4.6%) for the electrical resistivity, respectively.

Item Type:	Article
Date Type:	Publication
Status:	Published
Schools:	Engineering
Subjects:	T Technology > TK Electrical engineering. Electronics Nuclear engineering
Publisher:	American Institute of Physics
ISSN:	0034-6748
Funders:	Ministry of Science, Technology and Innovation (MOSTI) of Malaysia
Date of Acceptance:	25 April 2013
Last Modified:	28 Oct 2022 09:39
URI:	https://orca.cardiff.ac.uk/id/eprint/75191

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