Cardiff University | Prifysgol Caerdydd ORCA
Online Research @ Cardiff 
WelshClear Cookie - decide language by browser settings

A molecular dynamics study of the critical thickness of Ge layers on Si substrates

Ashu, P. and Matthai, Clarence Cherian 1991. A molecular dynamics study of the critical thickness of Ge layers on Si substrates. Applied Surface Science 48-49 , pp. 39-43. 10.1016/0169-4332(91)90304-3

Full text not available from this repository.

Abstract

Epitaxial growth can occur layer-by layer or by islanding. The mode of growth depends on the surface energies of the substrate and the epilayer. In cases of the growth of strained layers, the strain energy of the film also needs to be taken into account. This may results in the formation of misfit dislocations at the interface. Also where strain effects are important, initial layer-by-layer growth can become three-dimensional through islanding. Using the method of molecular dynamics and a many-body description of interatomic forces, we have made a study of the comparative energies of strained-relieved epilayers as well as (111) faceted islands of Ge on Si(001). We conclude that the critical thickness for this system is around 3 monolayers.

Item Type: Article
Date Type: Publication
Status: Published
Schools: Physics and Astronomy
Subjects: Q Science > QC Physics
Publisher: Elsevier
ISSN: 0169-4332
Last Modified: 04 Jun 2017 06:49
URI: http://orca-mwe.cf.ac.uk/id/eprint/65088

Citation Data

Cited 17 times in Google Scholar. View in Google Scholar

Cited 15 times in Scopus. View in Scopus. Powered By Scopus® Data

Actions (repository staff only)

Edit Item Edit Item