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Study of silicon tip wear during AFM probe-based machining of single crystal copper

Mukhtar, Nur Farah Hafizah, Brousseau, Emmanuel Bruno Jean Paul and Prickett, Paul William 2014. Study of silicon tip wear during AFM probe-based machining of single crystal copper. Presented at: Ninth International Conference on MicroManufacturing (ICOMM 2014), Nanyang Technological University (NTU) and National University of Singapore (NUS), Singapore, 25-28 March 2014.

Full text not available from this repository.
Item Type: Conference or Workshop Item (Paper)
Date Type: Completion
Status: Unpublished
Schools: Centre for Advanced Manufacturing Systems At Cardiff (CAMSAC)
Engineering
Subjects: T Technology > TA Engineering (General). Civil engineering (General)
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Last Modified: 04 Jun 2017 06:25
URI: http://orca-mwe.cf.ac.uk/id/eprint/59798

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