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Reconstructing residual stress depth profiles using magnetic Barkhausen noise method (FQ-12).

Mierczak, Lukasz, Melikhov, Yevgen and Jiles, David 2011. Reconstructing residual stress depth profiles using magnetic Barkhausen noise method (FQ-12). Presented at: 55th Conference on Magnetism and Magnetic Materials (MMM), Atlanta, USA, 14 - 18 November 2010. Proceedings of the 55th Annual Conference on Magnetism and Magnetic Materials Atlanta, Georgia, 14 - 18 November 2010 [55th MMM Annual Conference]. Melville, NY: American Institute of Physics, p. 209.

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Item Type: Conference or Workshop Item (Poster)
Date Type: Publication
Status: Published
Schools: Engineering
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
Additional Information: Session FQ: Magnetic sensors 1 (Poster Session)
Publisher: American Institute of Physics
ISBN: 9780735409248
Related URLs:
Last Modified: 10 Jun 2020 14:08
URI: http://orca-mwe.cf.ac.uk/id/eprint/40003

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