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Stress determination and magnetization reversal detection in FeSiAl(N) films using magnetic force microscopy with in-plane magnetic field capability

Snyder, John Evan, Lo, C. C. H., Leib, J., Chen, R., Kriegermeier, B., Kramer, M. J., Jiles, David and Kief, M. T. 2001. Stress determination and magnetization reversal detection in FeSiAl(N) films using magnetic force microscopy with in-plane magnetic field capability. Presented at: American Physical Society, March Meeting, Seattle, USA,

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Item Type: Conference or Workshop Item (Paper)
Schools: Engineering
Last Modified: 04 Jun 2017 03:26
URI: http://orca-mwe.cf.ac.uk/id/eprint/21336

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