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Detailed analysis of DC-RF dispersion in AIGaN/GaN NFETs using waveform measurements

Roff, R., McGovern, P., Benedikt, Johannes, Tasker, Paul J., Balmer, R. S., Walis, D. J., Hilton, K. P., MacLean, J. O., Hayes, D. G., Uren, Michael John and Martin, T. 2006. Detailed analysis of DC-RF dispersion in AIGaN/GaN NFETs using waveform measurements. Presented at: 1st European Microwave Integrated Circuits Conference (EuMIC), Manchester, UK, pp. 43-45.

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Item Type: Conference or Workshop Item (Paper)
Schools: Engineering
Last Modified: 04 Jun 2017 03:26
URI: http://orca-mwe.cf.ac.uk/id/eprint/21232

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