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Magnetic field gradient measurement on magnetic cards with magnetic force microscopy

Lo, C. C. H., Leib, J. and Jiles, David 2002. Magnetic field gradient measurement on magnetic cards with magnetic force microscopy. Presented at: Quantitative Nondestructive Evaluation (QNDE), Brunswick, ME, USA, 29 July - 3 August 2001. Review of Progress in Quantitative Nondestructive Evaluation. AIP Conference Proceedings , vol. 615. American Institute of Physics, pp. 999-1006. 10.1063/1.1472905

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Item Type: Conference or Workshop Item (Paper)
Date Type: Publication
Status: Published
Schools: Engineering
Publisher: American Institute of Physics
Last Modified: 04 Jun 2017 03:25
URI: http://orca-mwe.cf.ac.uk/id/eprint/21127

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