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Spectroscopic ellipsometry study of optical anisotropy in Gd5Si2Ge2 and comparison with reflectance difference spectra

Lee, S. J., M., Park J., Snyder, John Evan, Jiles, David, Lograsso, T. A., L., Schlagel D., Pecharsky, A. O. and Lynch, D. W. 2005. Spectroscopic ellipsometry study of optical anisotropy in Gd5Si2Ge2 and comparison with reflectance difference spectra. Presented at: March Meeting of the Americal Physical Society, Los Angeles, USA,

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Item Type: Conference or Workshop Item (Paper)
Schools: Engineering
Last Modified: 04 Jun 2017 03:25
URI: http://orca-mwe.cf.ac.uk/id/eprint/21052

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