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Experimental evaluation of an active envelope load pull architecture for high speed device characterization

Williams, Tudor, Tasker, Paul J. and Benedikt, Johannes 2005. Experimental evaluation of an active envelope load pull architecture for high speed device characterization. Presented at: IEEE MTT-S International Microwave Symposium Digest 2005, IEEE, 10.1109/MWSYM.2005.1516980

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Abstract

This paper presents a solution to the iterative nature of load pull characterization of transistor power performance. This has been achieved using a novel load pull architecture with a feedback loop at envelope frequencies within an active load pull system, which has been demonstrated and evaluated for single tone excitation. Furthermore employing the new architecture, a novel application is demonstrated which could be potentially useful in production environments, this is achieved using an amplitude modulated stimulus that reduces measurement time from hours to seconds.

Item Type: Conference or Workshop Item (Paper)
Date Type: Publication
Status: Published
Schools: Engineering
Uncontrolled Keywords: Load Pull ; Power Amplifiers ; Device Characterization ; Waveform measurements
Additional Information: Microwave Symposium Digest, 2005 IEEE MTT-S International 12-17 June 2005 Page(s):4 pp.
Publisher: IEEE
ISSN: 0149-645X
Last Modified: 04 Jun 2017 01:42
URI: http://orca-mwe.cf.ac.uk/id/eprint/1912

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