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Inclined-plane tests of textured silicone rubber samples

Sarkar, Partha, Haddad, Abderrahmane ORCID: https://orcid.org/0000-0003-4153-6146, Waters, Ronald T., Griffiths, Huw, Harid, Noureddine ORCID: https://orcid.org/0000-0001-8203-1895 and Charalampidis, Panagiotis 2010. Inclined-plane tests of textured silicone rubber samples. Presented at: International Conference on High Voltage Engineering and Application, New Orleans, LA, USA, 11-14 October 2010. 2010 International Conference on High Voltage Engineering and Application (ICHVE 2010). New York: IEEE, pp. 532-535. 10.1109/ICHVE.2010.5640708

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Abstract

The shank regions of a polluted polymeric insulator are vulnerable to thermal damage from partial arcs. To alleviate this problem, it has recently been proposed to contour the polymeric surface with regular patterns of protuberances in order to reduce both the leakage current density and electric field strength in such regions, and by the same means to achieve an increase in creepage length. The performance in inclined-plane tests of samples prepared with various types of textured pattern, and a range of sizes of hemispherical protuberances, are described, along with results for non-textured plane-surface samples for comparison. A remarkable improvement is achieved by such texturing in the satisfaction of the standard test criteria, and in limiting surface discharge activity and reducing the tracking and erosion of the sample.

Item Type: Conference or Workshop Item (Paper)
Status: Published
Schools: Engineering
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
Publisher: IEEE
ISBN: 9781424482832
Last Modified: 18 Oct 2022 14:17
URI: https://orca.cardiff.ac.uk/id/eprint/17054

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