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On-wafer W-band determination of the driving point impedance of a double slot antenna

Thayne, I. G., Edgar, D. L., Elgaid, K., Chong, H., Jubber, M., McLelland, H., Ferguson, S., Ross, A., Arnold, J. M., Heeres, R., Whybourn, N., Luinge, W., Van Der Vorst, M., Neto, A. and De Maagt, P. 2002. On-wafer W-band determination of the driving point impedance of a double slot antenna. Presented at: Colloquium on Microwave Measurements: Current Techniques and Trends, London, England, UK, 23 February 1999. IEE Colloquium on Microwave Measurements: Current Techniques and Trends (Ref. No. 1999/008). IET, pp. 3-4. 10.1049/ic:19990026

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Abstract

Part of the ESTEC funded Integrated Antenna Development project includes the development of an optimised 500 GHz planar antenna on a dielectric lens. One aspect of this study involves the development of an accurate model for the antenna impedance at the point where a bolometric detector is inserted in the receiver. To verify the modelling, an on-wafer measurement strategy to determine the driving point impedance of a 100 GHz scale model of the antenna structure was developed. This paper describes the W-band on-wafer measurement technique and compares the experimentally and theoretically derived feed point impedances of the antenna structures.

Item Type: Conference or Workshop Item (Paper)
Date Type: Published Online
Status: Published
Schools: Engineering
Publisher: IET
Last Modified: 17 Mar 2020 15:30
URI: http://orca-mwe.cf.ac.uk/id/eprint/122577

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