Cardiff University | Prifysgol Caerdydd ORCA
Online Research @ Cardiff 
WelshClear Cookie - decide language by browser settings

Comparison of two AFM probe inspection techniques for three-dimensional tip characterization

Alraziqi, Zaynab, Mukhtar, Nur Farah Hafizah and Brousseau, Emmanuel 2016. Comparison of two AFM probe inspection techniques for three-dimensional tip characterization. Presented at: 16th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2016, University of Nottingham, Nottingham, United Kingdom, 30 May - 3 June 2016. Published in: Bointon, P., Leach, Ronald K. and Southon, N. eds. Proceedings of the 16th International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2016. Cranfield, Bedfordshire, UK: euspen, pp. 639-646.

Full text not available from this repository.

Abstract

The utilisation of an accurate and practical method for characterising the three dimensional (3D) geometry of tips used in Atomic Force Microscopy (AFM) is essential to support reliable AFM-based applications. Indeed, knowledge of the tip condition is important not only when employing AFM for imaging the surface topography of samples on the nanoscale, but also when implementing AFM-based nanofabrication techniques. In this context, this paper reports a study carried out to compare the performance and practical suitability of two different 3D tip characterisation techniques, which can be realised on AFM instruments. The first technique consists in obtaining an inverted 3D image of the tip as a result of using it to scan sharp pin-like asperities in non-contact mode. The second technique relies on obtaining a direct AFM scan of the tip under investigation, again in non-contact mode, but this time by scanning its apex with an ultra-sharp tip employed as the AFM probe. Systematic comparative studies were conducted on different types of diamond coated AFM probes. In particular, tip profile data obtained with Scanning Electron Microscopy (SEM) were used as a reference against the cross sectional profiles extracted from the acquired 3D measurements with both techniques under evaluation. Between both 3D characterisation methods investigated, the utilisation of sharp pin-like asperities to obtain an inverted scan of the tip was judged to be superior as it is 1) less time-consuming to implement, 2) less prone to result in tip damage and 3) more accurate with respect to the geometric information extracted within a distance of 100 nm below the tip apex.

Item Type: Conference or Workshop Item (Paper)
Date Type: Publication
Status: Published
Schools: Engineering
Publisher: euspen
ISBN: 9780956679086
Last Modified: 27 Jul 2019 21:58
URI: http://orca-mwe.cf.ac.uk/id/eprint/104491

Citation Data

Cited 1 time in Scopus. View in Scopus. Powered By Scopus® Data

Actions (repository staff only)

Edit Item Edit Item